Structural and Optical Properties ofCdSxTe1-xThin Films Fabricated by Thermal Evaporation.

Structural and Optical Properties ofCdSxTe1-xThin Films Fabricated by Thermal Evaporation.

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CdSxTe1-x films in the range of ( x=0.9 , 0.8, 0.

7 ) about 300 nm thickness have been formed on glass substrates by thermal evaporation.X-ray results showed that the CdTe film was polycrystalline with cubic zinc blend structure and had preferred growth of grains along the (111) crystallographic direction.Also, CdS was polycrystalline with Heel - Elbow Protectors hexagonal wurtzitestructure and had preferred growth of grains along (002) crystallographic direction while CdSxTe1-x films studied the phase change with an inversion point related to the x-value.

Transmittance and absorbance spectra of the films were measured as a function of wavelength (300-1100)nm.Then the band gap of the films calculated by using absorption spectrum, where the direct optical energy gap for CdTe is 1.48 eV and Face Exfoliant for CdS is 2.

5 eVwhile the direct optical gap ofCdSxTe1-x films be limited to between CdS and CdTe , and varied non-linearly , showing downward with decrease x-value.Also the refractive index (n) of these films are discussed.